Zero-loss Filtered TEM Imaging of Microelectronic Structures Using In Column Filter Technology
نویسندگان
چکیده
منابع مشابه
Situ TEM Imaging of Transient Structures Using Nanosecond
www.sciencemag.org (this information is current as of August 7, 2009 ): The following resources related to this article are available online at http://www.sciencemag.org/cgi/content/full/321/5895/1472 version of this article at: including high-resolution figures, can be found in the online Updated information and services, http://www.sciencemag.org/cgi/content/full/321/5895/1472/DC1 can be foun...
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ژورنال
عنوان ژورنال: Microscopy and Microanalysis
سال: 2005
ISSN: 1431-9276,1435-8115
DOI: 10.1017/s1431927605501454